The aim of the International Symposium on Transport Network Reliability (INSTR) is to bring together researchers and professionals interested in transportation network reliability, to discuss both recent research and future directions in this increasingly important field of research. The scope of the symposium includes all aspects of analysis and design to improve network reliability.


  1. Kyoto (Aug 2001) [proceedings]
  2. Christchurch (Aug 2004) [proceedings]
  3. The Hague (July 2007)
  4. Minneapolis (2010) [selected papers][special section, TR part C]
  5. Hong Kong (2012)
  6. Nara (Aug 2015)
  7. Sydney (Jan 2018)
  8. Stockholm (June 2020)(June 2021)
  9. Hong Kong (December 2022) Details to be announced

International Scientific Committee

Convenor: Michael G. H. Bell, The University of Sydney, Australia
Members: Yasuo Asakura, Tokyo Institute of Technology, Japan
Anthony Chen, The Hong Kong Polytechnic University, Hong Kong SAR
Yu-Chiun Chiou, National Chiao Tung University, Taiwan
Nour-Eddin El Faouzi, Universite de Lyon, IFSTTAR, France
Elise Miller Hooks, George Mason University, US
Fumitaka Kurauchi, Gifu University, Japan
Masao Kuwahara, Tohoku University, Japan
Takamasa Iryo, Kobe University, Japan
Erik Jenelius, KTH Stockholm, Sweden
William H. K. Lam, The Hong Kong Polytechnic University, Hong Kong SAR
Seungjae Lee, The University of Seoul, Korea
David Levinson, University of Sydney, Australia
Hong K. Lo, The Hong Kong University of Science & Technology, Hong Kong SAR
Alan Nicholson, University of Canterbury, New Zealand
Wafaa Saleh, Napier University, U.K.
Jan-Dirk Schmöcker, Kyoto University, Japan
Maaike Snelder, Delft University of Technology, The Netherland
Wai Yuen Szeto, The University of Hong Kong, Hong Kong SAR
Michael A. P. Taylor, University of South Australia, Australia
Francesco Viti, University of Luxembourg, Luxembourg
David Watling, University of Leeds, U.K.
Hai Yang, The Hong Kong University of Science & Technology, Hong Kong SAR
Honory Members: Pasquale Colonna, Polytechnic University of Bari, Italy
Yasunori Iida, Kyoto University, Japan
Eiichi Taniguchi, Kyoto University, Japan
Henk J. van Zuylen, Delft University of Technology, The Netherland