The aim of the International Symposium on Transport Network Reliability (INSTR) is to bring together researchers and professionals interested in transportation network reliability, to discuss both recent research and future directions in this increasingly important field of research. The scope of the symposium includes all aspects of analysis and design to improve network reliability.
Conferences
- Kyoto (2001) [proceedings]
- Christchurch (2004) [proceedings]
- The Hague (2007)
- Minneapolis (2010) [selected papers][special section, TR part C]
- Hong Kong (2012)
- Nara (2015)
- Sydney (Jan 2018)
- Stockholm (July/August 2020) Details to be announced
- Hong Kong (December 2022) Details to be announced
International Scientific Committee
| Convenor： | Michael G. H. Bell, The University of Sydney, Australia |
| Members： | Yasuo Asakura, Tokyo Institute of Technology, Japan Anthony Chen, The Hong Kong Polytechnic University, Hong Kong SAR Yu-Chiun Chiou, National Chiao Tung University, Taiwan Nour-Eddin El Faouzi, Universite de Lyon, IFSTTAR, France Elise Miller Hooks, George Mason University, US Fumitaka Kurauchi, Gifu University, Japan Maso Kuwahara, Tohoku University, Japan Takamasu Iryo, Kobe University, Japan Erik Jenelius, KTH Stockholm, Sweden William H. K. Lam, The Hong Kong Polytechnic University, Hong Kong SAR Seungjae Lee, The University of Seoul, Korea David Levinson, University of Sydney, Australia Hong K. Lo, The Hong Kong University of Science & Technology, Hong Kong SAR Alan Nicholson, University of Canterbury, New Zealand Wafaa Saleh, Napier University, U.K. Jan-Dirk Schmöcker, Kyoto University, Japan Maaike Snelder, Delft University of Technology, The Netherland Wai Yuen Szeto, The University of Hong Kong, Hong Kong SAR Michael A. P. Taylor, University of South Australia, Australia Francesco Viti, University of Luxembourg, Luxembourg David Watling, University of Leeds, U.K. Hai Yang, The Hong Kong University of Science & Technology, Hong Kong SAR |
| Honory Members： | Pasquale Colonna, Polytechnic University of Bari, Italy Yasunori Iida, Kyoto University, Japan Eiichi Taniguchi, Kyoto University, Japan Henk J. van Zuylen, Delft University of Technology, The Netherland |
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